Technical Note: A New Approach to Low-Level Measurements of Nanostructures

How to overcome the challenges of characterizing ultra-small structures

Electronic device structures are getting increasingly smaller. And because they're smaller, they can only tolerate extremely low stimulus currents and voltages, which reduce measurable signals close to the noise floor of typical instrumentation and experimental setups. This technical note explores a new approach to making such low-level signal measurements, one that utilizes optimum sensitivity, noise rejection, and uninterrupted acquisition of data as a means to more confidently characterize such materials.

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